Observation of the early stages of GaN thermal decomposition at 1200°C under N2

被引:10
作者
Bouazizi, H. [1 ]
Bouzidi, M. [1 ]
Chaaben, N. [1 ]
El Gmili, Y. [2 ]
Salvestrini, J. P. [2 ]
Bchetnia, A. [1 ]
机构
[1] Univ Monastir, Fac Sci Monastir 5019, Unite Rech Heteroepitaxies & Applicat, Monastir, Tunisia
[2] Univ Lorraine, CNRS, Georgia Inst Technol 2958, Unite Mixte Int, F-57070 Metz, France
来源
MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS | 2018年 / 227卷
关键词
MOVPE; Decomposition; GaN; In situ-reflectance; SEM; THIN-FILMS; STABILITY; LAYERS; MOVPE; TEMPERATURES; DEPENDENCE; NITRIDE; DEFECTS; H-2;
D O I
10.1016/j.mseb.2017.10.002
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigated the partial decomposition of GaN layers grown in an atmospheric pressure metal organic vapor phase epitaxy (AP-MOVPE) vertical reactor at 1200 degrees C under N-2 ambient. In these conditions, the early stages of GaN thermal decomposition were studied. The GaN decomposition was monitored by in-situ laser reflectometry (LR). The properties of the as grown and decomposed GaN samples were analyzed by scanning electron microscope (SEM). We show that GaN decomposition starts by the formation of GaN nano-grains at the early stages. Then, due to the anisotropy of the decomposition, the GaN nano-grains are more easily etched than the GaN (00.2) surface. The lateral etching may results in local smooth GaN surface formation. After that the depth etching starts again on the etched pits. Room temperature cathodoluminescence (CL) study revealed better optical properties of the GaN grains when compared to the whole GaN surface.
引用
收藏
页码:16 / 21
页数:6
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