Fourier ptychographic microscopy at telecommunication wavelengths using a femtosecond laser

被引：1

作者：

Ahmed, Ishtiaque ^{[1
,3
]}

Alotaibi, Maged ^{[1
,3
]}

Skinner-Ramos, Sueli ^{[1
,3
]}

Dominguez, Daniel ^{[1
,3
]}

Bernussi, Ayrton A. ^{[2
,3
]}

de Peralta, Luis Grave ^{[1
,3
]}

机构：

[1] Texas Tech Univ, Dept Phys & Astron, Lubbock, TX 79409 USA

[2] Texas Tech Univ, Dept Elect & Comp Engn, Lubbock, TX 79409 USA

[3] Texas Tech Univ, Nano Tech Ctr, Lubbock, TX 79409 USA

来源：

OPTICS COMMUNICATIONS | 2017年 / 405卷

基金：

美国国家科学基金会;

关键词：

Microscopy; Image formation theory; Illumination design; HEMISPHERICAL DIGITAL CONDENSER; WIDE-FIELD; ILLUMINATION; PHASE; IMPLEMENTATION; RESOLUTION;

D O I：

10.1016/j.optcom.2017.08.034

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We report the implementation of the Fourier Ptychographic Microscopy (FPM) technique, a phase retrieval technique, at telecommunication wavelengths using a low-coherence ultrafast pulsed laser source. High quality images, near speckle-free, were obtained with the proposed approach. We demonstrate that FPM can also be used to image periodic features through a silicon wafer. (C) 2017 Elsevier B.V. All rights reserved.

引用

页码：363 / 367

页数：5

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