Exploring the effects of interfacial carrier transport layers on device performance and optoelectronic properties of planar perovskite solar cells

被引:126
作者
Khadka, Dhruba B. [1 ]
Shirai, Yasuhiro [1 ]
Yanagida, Masatoshi [1 ]
Ryan, James W. [1 ,2 ]
Miyano, Kenjiro [1 ]
机构
[1] NIMS, Global Res Ctr Environm & Energy Based Nanomat Sc, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan
[2] NIMS, ICYS, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan
关键词
OPEN-CIRCUIT VOLTAGE; HYSTERESIS-FREE; LOW-TEMPERATURE; ION MIGRATION; THIN-FILMS; EFFICIENCY; FABRICATION; STABILITY; QUALITY; LOSSES;
D O I
10.1039/c7tc02822a
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigated the effects of carrier transport layer on performance of perovskite device and limitation factors by analysing the optoelectronic properties. The device efficiency was enhanced from similar to 14.5% to similar to 18.1% by replacing hole transport layer (HTL) PEDOT:PSS with PTAA, governed by increase in open circuit voltage and short circuit current. We found that PTAA device leads to the improvement in interface layer quality, efficient carrier transport and mitigation of bulk defect activities. The analysis of temperature and intensity dependent current-voltage characteristics suggests that PEDOT: PSS device is limited by interface and trap assisted recombination. The capacitance spectroscopy and electroluminescence revealed soothing of recombination activities as a consequence of better interface quality and shallower defect level for PTAA device. Our results consolidate that the perovskite film and interface quality and recombination activities in device are dominantly influenced by HTLs which pave a way for further enhancement in efficiency coupled with excellent interfacial carrier transport layer.
引用
收藏
页码:8819 / 8827
页数:9
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