Composition and temperature dependence of the refractive index in Hg1-xCdxTe over the visible light region

被引：0

作者：

Jiang, RQ ^{[1
]}

Xia, YY ^{[1
]}

Zhang, Y ^{[1
]}

Fang, JX ^{[1
]}

机构：

[1] Shandong Univ, Infrared & Remote Sensing Res Lab, Jinan 250100, Peoples R China

来源：

DETECTORS, FOCAL PLANE ARRAYS, AND IMAGING DEVICES II | 1998年 / 3553卷

关键词：

HgCdTe; refractive index; E-1(x; T); ellipsometry;

D O I：

10.1117/12.318091

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We measured refractive index of n type Hg1-xCdxTe with the null ellipsometric spectrum method over the visible light region, and the dispersion spectra with compositions x ranging from 0.2 to 0.46 have been obtained at different temperature. The reflectivity has been calculated in the wavelength region above the absorption edge at temperatures from 77K to 300K. A peak over the visible light region appears just at the wavelength corresponding to the band-gap energy E-1(x,T) of Hg1-xCdxTe. E-1(x,T) can be described by an empirical formula.

引用

页码：33 / 36

页数：4