The impact of manufacturing errors of domain structure on frequency doubling efficiency in PPLN waveguides

被引：0

作者：

Liu, Zhengying ^{[1
]}

Ren, Aihong ^{[1
]}

Zhang, Rongzhu ^{[1
]}

Liu, Jinglun ^{[1
]}

Sun, Nianchun ^{[1
]}

Chen, Jianguo ^{[1
]}

机构：

[1] Sichuan Univ, Coll Elect & Informat Engn, Res Ctr Photoelectron, Chengdu 610065, Peoples R China

来源：

5TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: DESIGN, MANUFACTURING, AND TESTING OF MICRO- AND NANO-OPTICAL DEVICES AND SYSTEMS | 2010年 / 7657卷

关键词：

manufacturing error; conversion efficiency; error tolerance; 2ND HARMONIC-GENERATION;

D O I：

10.1117/12.865718

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

While the length of polarization period in the periodically poled (PP) waveguides has manufacturing errors (MEs), the impact of this errors on Quasi-Phase-Macthed (QPM) frequency doubling efficiency (FDE), and that of polarization period Lambda(0) and length of the waveguides at the direction of transmission beams on ME tolerance, which are all theoretically analyzed. The results show that with the ME increasing, FDE decreases rapidly. And the ME tolerance of PP waveguides is inversely proportional to the length of waveguides and is directly proportional to the polarization period Lambda(0). These results provide a theoretical basis for choosing material of periodically poled crystal (PPC) and controlling MEs.

引用

页数：5

共 6 条

[1] QUASI-PHASE-MATCHED 2ND HARMONIC-GENERATION - TUNING AND TOLERANCES [J].