Well-behaved global on-chip interconnect

被引:4
作者
Caputa, P [1 ]
Svensson, C [1 ]
机构
[1] Linkoping Univ, Dept Elect Engn, S-58183 Linkoping, Sweden
关键词
interconnect; global interconnect; interconnect delay; on-chip bus; upper-level metal;
D O I
10.1109/TCSI.2004.840483
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Global interconnects have been identified as a serious limitation to chip scaling, due to their latency and power consumption. We demonstrate a scheme to overcome these limitations, based on the utilization of upper-level metals, combined with structured communication architecture. Microwave style transmission lines in upper-level metals allow close-to-velocity-of-light delays if properly dimensioned. As an example, we demonstrate a 480-mum-wide and 20-mm-long bus with a capacity,of 320 Gb/s in a nearly standard 0.18-mum process. The process differs from a standard process only through a somewhat thicker outer, metal layer. We further illustrate how "self pre-emphasis" at the launch of a data pulse can be used to double the maximum available data rate over a wire. The proposed techniques are scalable, given that higher level metals are properly dimensioned in future processes.
引用
收藏
页码:318 / 323
页数:6
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