Nucleation and surface morphology evolution of ferroelectric SrBi2Ta2O9 films studied by atomic force microscopy

被引：12

作者：

Jiang, QD ^{[1
]}

Huang, ZJ

Jin, P

Chen, CL

Brazdeikis, A

Sun, YY

Feng, HH

机构：

[1] Univ Houston, Texas Ctr Supercond, Houston, TX 77204 USA

[2] Univ Houston, Dept Phys, Houston, TX 77204 USA

来源：

SURFACE SCIENCE | 1998年 / 405卷 / 2-3期

基金：

美国国家科学基金会;

关键词：

atomic force microscopy; ferroelectrics; insulating films; nucleation; SrBi2Ta2O9; surface morphology;

D O I：

10.1016/S0039-6028(98)00167-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Nucleation stages and surface morphology evolution of epitaxial SrBi2Ta2O9 thin films on SrTiO3 (001) substrates have been studied by ultra-high vacuum atomic force microscopy. The SrBi2Ta2O9 nucleates and grows half-unit-cell by half-unit-cell as well-defined 2D islands at low coverage. After 2D growth stage, which proceeds up to several half unit-cell layers, a transition from 2D to 3D island growth is observed. After coalescence of small 3D islands into larger islands. clear columnar structures, consisting of spirals, emerge. The surfaces of films with their thickness above 1500 Angstrom exhibit round hills consisting of curved terraces with sizes of steps ranging from 6 Angstrom to 12.5 Angstrom. (C) 1998 Elsevier Science B.V. all rights reserved.

引用

页码：L554 / L560

页数：7

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