aluminium;
atom-solid interactions;
scattering;
diffraction;
atom-solid scattering and diffraction : inelastic;
ion-solid interactions;
channelling;
low energy ion scattering;
D O I:
10.1016/S0039-6028(98)00242-8
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
In a detailed analysis of image charge effects on the trajectories of He+ ions with keV energies scattered from a clean Al(111) surface under a grazing angle of incidence we find evidence for contributions from two different Auger processes. From our data we derive Auger neutralization rates for the filling of the Is hole and the Auger deexcitation rate for the 2s S-3 level as function of the distance from the surface. The rates are obtained from the experiments in a straightforward manner and can be considered as a profound basis for the comparison with theoretical calculations. (C) 1998 Elsevier Science B.V. All rights reserved.
机构:
UNL, CONICET, INTEC, Inst Desarrollo Tecnol Ind Quim, Santa Fe, Argentina
Univ Nacl Litoral, Fac Humanidades & Ciencias, Santa Fe, ArgentinaUNL, CONICET, INTEC, Inst Desarrollo Tecnol Ind Quim, Santa Fe, Argentina
Iglesias-Garcia, A.
Garcia, Evelina A.
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机构:
UNL, CONICET, INTEC, Inst Desarrollo Tecnol Ind Quim, Santa Fe, ArgentinaUNL, CONICET, INTEC, Inst Desarrollo Tecnol Ind Quim, Santa Fe, Argentina
Garcia, Evelina A.
Goldberg, E. C.
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h-index: 0
机构:
UNL, CONICET, INTEC, Inst Desarrollo Tecnol Ind Quim, Santa Fe, Argentina
UNL, Fac Ingn Quim, Dept Ingn Mat, Santa Fe, ArgentinaUNL, CONICET, INTEC, Inst Desarrollo Tecnol Ind Quim, Santa Fe, Argentina