A method to recover design patterns using software product metrics

被引:0
|
作者
Kim, H
Boldyreff, C
机构
[1] City Univ London, Dept Comp, SERG, London EC1V 0HB, England
[2] Univ Durham, Dept Comp Sci, RISE, Durham DH1 3LE, England
来源
SOFTWARE REUSE: ADVANCES IN SOFTWARE REUSABILITY | 2000年 / 1844卷
关键词
design pattern recovery; software product metrics; design reuse;
D O I
暂无
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Software design patterns are a way of facilitating design reuse in object-oriented systems by capturing recurring design practices. Lots of design patterns have been identified and, further, various usages of patterns are known, e.g., documenting frameworks and reengineering legacy systems [8, 15]. To benefit fully from using the new concept, we need to develop more systematic methods of capturing design patterns. In this paper, we propose a new method to recover the GoF(1) patterns using software measurement skills. We developed a design pattern CASE tool to facilitate the easy application of our method. To demonstrate the usefulness of our approach, we carried out a case study, and its experimental results are reported.
引用
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页码:318 / 335
页数:18
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