Role of microstructure in the grinding and polishing of α-sialon ceramics

被引：29

作者：

Xie, ZH ^{[1
]}

Moon, RJ

Hoffman, M

Munroe, P

Cheng, YB

机构：

[1] Univ New S Wales, Sch Mat Sci & Engn, Sydney, NSW 2052, Australia

[2] Monash Univ, Sch Phys & Mat Engn, Clayton, Vic 3800, Australia

来源：

JOURNAL OF THE EUROPEAN CERAMIC SOCIETY | 2003年 / 23卷 / 13期

关键词：

focus ion beam (FIB) technique; grinding; microstructure; polishing; sialons;

D O I：

10.1016/S0955-2219(03)00046-3

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The grinding and polishing behaviour of three tailored alpha-sialon microstructures made of the same chemical composition: fine-grained, bimodal and large elongated-grained, were determined. The fine-grained microstructure was characterised by extensive lateral cracks in the grinding process and widespread grain pullout during the mechanical polishing; in contrast, the large elongated-grained microstructure exhibited high grinding damage resistance, and a defect-free, mirror-like surface after mechanical polishing. The bimodal microstructure showed an intermediate behaviour during both processes. The material removal mechanisms during grinding and polishing were analysed and modelled as a function of grain size and aspect ratio. (C) 2003 Elsevier Ltd. All rights reserved.

引用

页码：2351 / 2360

页数：10

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