Interface passivation using ultrathin polymer-fullerene films for high-efficiency perovskite solar cells with negligible hysteresis

被引:393
作者
Peng, Jun [1 ]
Wu, Yiliang [1 ]
Ye, Wang [2 ]
Jacobs, Daniel A. [1 ]
Shen, Heping [1 ]
Fu, Xiao [1 ]
Wan, Yimao [1 ]
Duong, The [1 ]
Wu, Nandi [1 ]
Barugkin, Chog [1 ]
Nguyen, Hieu T. [1 ]
Zhong, Dingyong [2 ]
Li, Juntao [2 ]
Lu, Teng [3 ]
Liu, Yun [3 ]
Lockrey, Mark N. [4 ]
Weber, Klaus J. [1 ]
Catchpolea, Kylie R. [1 ]
White, Thomas P. [1 ,2 ]
机构
[1] Australian Natl Univ, Res Sch Engn, Canberra, ACT 2601, Australia
[2] Sun Yat Sen Univ, Sch Phys, State Key Lab Optoelect Mat & Technol, Guangzhou 510275, Guangdong, Peoples R China
[3] Australian Natl Univ, Res Sch Chem, Canberra, ACT 2601, Australia
[4] Australian Natl Univ, Res Sch Phys & Engn, Dept Elect Mat Engn, Australian Natl Fabricat Facil, 2601, Canberra, ACT 2601, Australia
基金
澳大利亚研究理事会;
关键词
PERFORMANCE; VOLTAGE; STABILITY; BEHAVIOR; ORIGIN; LAYERS;
D O I
10.1039/c7ee01096f
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Interfacial carrier recombination is one of the dominant loss mechanisms in high efficiency perovskite solar cells, and has also been linked to hysteresis and slow transient responses in these cells. Here we demonstrate an ultrathin passivation layer consisting of a PMMA: PCBM mixture that can effectively passivate defects at or near to the perovskite/TiO2 interface, significantly suppressing interfacial recombination. The passivation layer increases the open circuit voltage of mixed-cation perovskite cells by as much as 80 mV, with champion cells achieving V-oc similar to 1.18 V. As a result, we obtain efficient and stable perovskite solar cells with a steady-state PCE of 20.4% and negligible hysteresis over a large range of scan rates. In addition, we show that the passivated cells exhibit very fast current and voltage response times of less than 3 s under cyclic illumination. This new passivation approach addresses one of the key limitations of current perovskite cells, and paves the way to further efficiency gains through interface engineering.
引用
收藏
页码:1792 / 1800
页数:9
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