Rapid Thickness Identification Methodology For Two-Dimensional MoS2 and In2Se3 Nanosheets Using Optical Microscopy

被引：0

作者：

Wu, Darren ^{[1
]}

Li, Qiu ^{[1
]}

Wang, Feifan ^{[1
]}

Li, Tiantian ^{[1
]}

Gu, Tingyi ^{[1
]}

机构：

[1] Univ Delaware, Dept Elect & Comp Engn, Newark, DE 19176 USA

来源：

2020 9TH IEEE INTEGRATED STEM EDUCATION CONFERENCE (ISEC 2020) | 2020年

关键词：

D O I：

暂无

中图分类号：

G40 [教育学];

学科分类号：

040101 ; 120403 ;

摘要：

The development of a novel and accurate thickness identification methodology is imperative for the continued study and potential commercialization of two-dimensional (213) materials. Through experimentation, an effective and straightforward methodology has been produced for the thickness identification of MoS2 and In2Se3 nanosheets on 300nm Si/SiO2 under optical microscopy from approximately single to decuple layer numbers. The optical contrast difference values of the atomically-thin nanostructures were collected throughout and arranged into a standard reference index which was correlated to height number in nanometers. Using this method, the thickness of a substance could be simply and accurately determined without the use of complex instrumentation, experimental setup, and calculation, therefore, saving time and financial costs.

引用

页数：1