Distribution High Impedance Fault Location Using Localized Voltage Magnitude Measurements

被引:0
|
作者
Hossain, Shamina [1 ]
Zhu, Hao [1 ]
Overbye, Thomas [1 ]
机构
[1] Univ Illinois, Elect & Comp Engn, Urbana, IL 61801 USA
来源
2014 NORTH AMERICAN POWER SYMPOSIUM (NAPS) | 2014年
关键词
high impedance fault; fault location; voltage sags; distributed monitoring devices;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The detection and location of high impedance faults has historically been a difficult endeavor due to the low currents produced. However, the recent advent of distributed voltage monitoring devices, enabling access to fast-sampled, expansive voltage measurements throughout a distribution network, can ease this task. This paper considers the potential to use these distribution level devices to detect and locate such faults. A simulation-based method is proposed that compares a measured voltage profile, obtained from the devices, and simulated voltage profiles at various locations using a power system simulation software. The simulation locations are intelligently selected using the Golden section search and possible fault impedance values are iterated through for each location. The L1-norm is used to compare the two profiles, with the lowest error norm representing the best match - the most likely fault location and impedance.
引用
收藏
页数:6
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