High-resolution friction force microscopy under electrochemical control

被引：33

作者：

Labuda, Aleksander ^{[1
]}

Paul, William ^{[1
]}

Pietrobon, Brendan ^{[2
]}

Lennox, R. Bruce ^{[2
]}

Gruetter, Peter H. ^{[1
]}

Bennewitz, Roland ^{[1
,3
]}

机构：

[1] McGill Univ, Dept Phys, Montreal, PQ H3A 2T8, Canada

[2] McGill Univ, Dept Chem, Montreal, PQ H3A 2K6, Canada

[3] INM Leibniz Inst New Mat, D-66123 Saarbrucken, Germany

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 08期

基金：

加拿大创新基金会; 加拿大自然科学与工程研究理事会;

关键词：

SINGLE-CRYSTAL ELECTRODES; ATOMIC-SCALE FRICTION; UNDERPOTENTIAL DEPOSITION; LATERAL STIFFNESS; CANTILEVERS; NANOTRIBOLOGY; CONTACT; TIP;

D O I：

10.1063/1.3470107

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We report the design and development of a friction force microscope for high-resolution studies in electrochemical environments. The design choices are motivated by the experimental requirements of atomic-scale friction measurements in liquids. The noise of the system is analyzed based on a methodology for the quantification of all the noise sources. The quantitative contribution of each noise source is analyzed in a series of lateral force measurements. Normal force detection is demonstrated in a study of the solvation potential in a confined liquid, octamethylcyclotetrasiloxane. The limitations of the timing resolution of the instrument are discussed in the context of an atomic stick-slip measurement. The instrument is capable of studying the atomic friction contrast between a bare Au(111) surface and a copper monolayer deposited at underpotential conditions in perchloric acid. (C) 2010 American Institute of Physics. [doi:10.1063/1.3470107]

引用

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