Wiener-Hopf Analysis of the Plane Wave Diffraction by a Thin Material Strip: the Case of H Polarization

被引:0
|
作者
Nagasaka, T. [1 ]
Kobayashi, K. [1 ]
机构
[1] Chuo Univ, Dept Elect Elect & Commun Engn, Bunkyo Ku, Tokyo 1128551, Japan
来源
PROCEEDINGS OF THE 2015 INTERNATIONAL CONFERENCE ON ELECTROMAGNETICS IN ADVANCED APPLICATIONS (ICEAA) | 2015年
关键词
HIGH-FREQUENCY SCATTERING;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The H-polarized plane wave diffraction by a thin material strip is analyzed using the Wiener-Hopf technique together with approximate boundary conditions. An asymptotic solution is obtained under the condition that the thickness and the width of the strip are small and large compared with the wavelength, respectively. The scattered field is evaluated asymptotically based on the saddle point method and a far field expression is derived. Scattering characteristics of the strip are discussed via numerical results of the radar cross section.
引用
收藏
页码:626 / 629
页数:4
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