Demonstration of a far-infrared streak camera

被引：11

作者：

Drabbels, M

Lankhuijzen, GM

Noordam, LD

机构：

[1] FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands

[2] Free Univ Amsterdam, Dept Chem Phys, NL-1081 HV Amsterdam, Netherlands

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1998年 / 34卷 / 11期

关键词：

free-electron laser; infrared detector; streak camera; ultrafast electronics; ultrafast optics;

D O I：

10.1109/3.726606

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An atomic infrared (IR) streak camera is demonstrated that operates in the mid- and far-infrared (lambda = 5-85 mu m), web beyond the long wavelength cutoff of conventional streak cameras. The temporal and spectral characteristics of the streak camera are determined using the FELIX free-electron laser as the IR light source. The temporal resolution of the streak camera was found to be as short as 1.2 ps. The high sensitivity of the streak camera is demonstrated by single-shot characterization of the IR pulses of FELIX.

引用

页码：2138 / 2144

页数：7

共 17 条

[1] THEORETICAL INVESTIGATION ON PHOTOIONIZATION FROM RYDBERG STATES OF LITHIUM, SODIUM AND POTASSIUM [J].