Ripple current loss measurement with DC bias condition for high temperature superconducting power cable using calorimetry method

被引：5

作者：

Kim, D. W. ^{[1
]}

Kim, J. G. ^{[1
]}

Kim, A. R. ^{[1
]}

Park, M. ^{[1
]}

Yu, I. K. ^{[1
]}

Sim, K. D. ^{[2
]}

Kim, S. H. ^{[2
]}

Lee, S. J. ^{[2
]}

Cho, J. W. ^{[2
]}

Won, Y. J. ^{[3
]}

机构：

[1] Changwon Natl Univ, Chang Won 641773, South Korea

[2] Korea Electrotechnol Res Inst, Superconducting Device & Cryogen Grp, Chang Won 641120, South Korea

[3] Korea Elect Power Corp, Seoul, South Korea

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2010年 / 470卷 / 20期

关键词：

High temperature superconducting cable; AC loss; DC power cable; Calorimetric method; BSCCO; Ripple dependent loss (RDL); AC LOSSES; TRANSMISSION; TAPES;

D O I：

10.1016/j.physc.2010.05.171

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The authors calculated the loss of the High Temperature Superconducting (HTS) model cable using Norris ellipse formula, and measured the loss of the model cable experimentally. Two kinds of measuring method are used. One is the electrical method, and the other is the calorimetric method. The electrical method can be used only in AC condition. But the calorimetric method can be used in both AC and DC bias conditions. In order to propose an effective measuring approach for Ripple Dependent Loss (RDL) under DC bias condition using the calorimetric method, Bismuth Strontium Calcium Copper Oxide (BSCCO) wires were used for the HTS model cable, and the SUS tapes were used as a heating tape to make the same pattern of the temperature profiles as in the electrical method without the transport current. The temperature-loss relations were obtained by the electrical method, and then applied to the calorimetric method by which the RDL under DC bias condition was well estimated. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：1601 / 1605

页数：5

共 10 条

[1] Experimental determination of the losses produced by the interaction of AC magnetic fields and transport currents in HTS tapes [J].