Electrical impedance tomography

被引：835
|
作者：
Cheney, M [1 ]
Isaacson, D [1 ]
Newell, JC [1 ]
机构：
[1] Rensselaer Polytech Inst, Troy, NY 12180 USA
来源：
SIAM REVIEW | 1999年 / 41卷 / 01期
关键词：
electrical impedance tomography; pulmonary embolus; inverse boundary value problem;
D O I：
10.1137/S0036144598333613
中图分类号：
O29 [应用数学];
学科分类号：
070104 ;
摘要：
This paper surveys some of the work our group has done in electrical impedance tomography.
引用
收藏
页码：85 / 101
页数：17
相关论文
共 50 条
  • [1] Electrical impedance tomography
    Lobo, Beatriz
    Hermosa, Cecilia
    Abella, Ana
    Gordo, Federico
    ANNALS OF TRANSLATIONAL MEDICINE, 2018, 6 (02)
  • [2] Electrical impedance tomography
    Saulnier, GJ
    Blue, RS
    Newell, JC
    Isaacson, D
    Edic, PM
    IEEE SIGNAL PROCESSING MAGAZINE, 2001, 18 (06) : 31 - 43
  • [3] Electrical impedance tomography
    Kotre, CJ
    BRITISH JOURNAL OF RADIOLOGY, 1997, 70 : S200 - S205
  • [4] Electrical Impedance Tomography
    Hinz, Jose
    CURRENT RESPIRATORY MEDICINE REVIEWS, 2009, 5 (02) : 105 - 109
  • [5] Electrical impedance tomography
    Borcea, L
    INVERSE PROBLEMS, 2002, 18 (06) : R99 - R136
  • [6] Electrical impedance tomography
    Costa, Eduardo L. V.
    Lima, Raul Gonzalez
    Amato, Marcelo B. P.
    CURRENT OPINION IN CRITICAL CARE, 2009, 15 (01) : 18 - 24
  • [7] Bioimpedance tomography (Electrical impedance tomography)
    Bayford, R. H.
    ANNUAL REVIEW OF BIOMEDICAL ENGINEERING, 2006, 8 : 63 - 91
  • [8] Multi-frequency Electrical Impedance Tomography and Magnetic Resonance Electrical Impedance Tomography
    Seo, Jin Keun
    Woo, Eung Je
    MATHEMATICAL MODELING IN BIOMEDICAL IMAGING I: ELECTRICAL AND ULTRASOUND TOMOGRAPHIES, ANOMALY DETECTION, AND BRAIN IMAGING, 2009, 1983 : 1 - 71
  • [9] Practical Application of Electrical Impedance Tomography and Electrical Resistive Tomography
    Kriz, T.
    Roubal, Z.
    2016 PROGRESS IN ELECTROMAGNETICS RESEARCH SYMPOSIUM (PIERS), 2016, : 1499 - 1503
  • [10] Electrical impedance tomography in epilepsy
    Holder, D
    ELECTRONIC ENGINEERING, 1998, 70 (859): : 69 - 70
12345