The Impact of Damping on the Frequency Stability of Nonlinear MEMS Oscillators

被引:17
作者
Zou, Xudong [1 ]
Seshia, Ashwin A. [1 ]
机构
[1] Univ Cambridge, Dept Engn, Cambridge CB2 1TN, England
关键词
MEMS; oscillators; nonlinear effects; air damping; phase noise; NANOMECHANICAL RESONATORS; NOISE; MODE; SYSTEMS; SENSOR;
D O I
10.1109/JMEMS.2015.2391832
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Linear models for oscillator noise predict an improvement in frequency stability with increasing quality factor. Although it is well known that this result does not apply to oscillators embedding nonlinear resonators, systematic experimental investigations of the impact of damping on frequency stability of nonlinear microelectromechanical system (MEMS) oscillators has not been previously reported. This paper studies the frequency stability of a nonlinear MEMS oscillator under variable damping conditions. Analytical and experimental investigation of a MEMS square-wave oscillator embedding a double-ended tuning fork resonator driven into the nonlinear regime is introduced. The experimental results indicate that for a preset drive level, the variation of air damping changes the onset of nonlinear behavior in the resonator, which not only impacts the output frequency, but also the phase/frequency noise of a nonlinear MEMS square wave oscillator. The random walk frequency noise and flicker frequency noise levels are strongly correlated with the nonlinear operating point of the resonator, whereas the white phase and white frequency noise levels are impacted both by the output power and by operative nonlinearities.
引用
收藏
页码:537 / 544
页数:8
相关论文
共 41 条
[1]  
Agarwal M, 2006, PROCEEDINGS OF THE 2006 IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM AND EXPOSITION, VOLS 1 AND 2, P209
[2]   Modeling Nonlinearities in MEMS Oscillators [J].
Agrawal, Deepak K. ;
Woodhouse, Jim ;
Seshia, Ashwin A. .
IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 2013, 60 (08) :1646-1659
[3]   STATISTICS OF ATOMIC FREQUENCY STANDARDS [J].
ALLAN, DW .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (02) :221-&
[4]  
[Anonymous], P 2012 IEEE INT FREQ
[5]   A SiC MEMS resonant strain sensor for harsh environment applications [J].
Azevedo, Robert G. ;
Jones, Debbie G. ;
Jog, Anand V. ;
Jamshidi, Babak ;
Myers, David R. ;
Chen, Li ;
Fu, Xiao-an ;
Mehregany, Mehran ;
Wijesundara, Muthu B. J. ;
Pisano, Albert P. .
IEEE SENSORS JOURNAL, 2007, 7 (3-4) :568-576
[6]   Squeeze film air damping in MEMS [J].
Bao, Minhang ;
Yang, Heng .
SENSORS AND ACTUATORS A-PHYSICAL, 2007, 136 (01) :3-27
[7]   CMOS MEMS oscillator for gas chemical detection [J].
Bedair, SS ;
Fedder, GK .
PROCEEDINGS OF THE IEEE SENSORS 2004, VOLS 1-3, 2004, :955-958
[8]   Long-term and accelerated life testing of a novel single-wafer vacuum encapsulation for MEMS resonators [J].
Candler, Rob N. ;
Hopcroft, Matthew A. ;
Kim, Bongsang ;
Park, Woo-Tae ;
Melamud, Renata ;
Agarwal, Manu ;
Yama, Gary ;
Partridge, Aaron ;
Lutz, Markus ;
Kenny, Thomas W. .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2006, 15 (06) :1446-1456
[9]   Noise processes in nanomechanical resonators [J].
Cleland, AN ;
Roukes, ML .
JOURNAL OF APPLIED PHYSICS, 2002, 92 (05) :2758-2769
[10]   Mechanisms of noise sources in microelectromechanical systems [J].
Djuric, Z .
MICROELECTRONICS RELIABILITY, 2000, 40 (06) :919-932