X-ray spectral power measurements utilizing the diffraction pattern of a slit

An instrument is described which can obtain x-ray spectral power measurements utilizing the diffraction pattern produced when x rays pass through a slit. Traditionally, these types of measurements yielding low to moderate spectral resolution have been made with filtered x-ray diodes or with a transmission grating. The instrument described below has several advantages over filtered x-ray diodes in determining the spectral power profile such as an insensitivity to surface contamination. In addition, this instrument does not require the use of filters which can be destroyed during a shot making absolute measurements difficult and very time consuming. The advantages over a transmission grating system include cost, mechanical robustness, and fewer components which require spectral calibration. (C) 1999 American Institute of Physics. [S0034-6748(99)04303-8].