Electron collision rates for ultraviolet and X-ray lines of S x

被引:0
作者
Tayal, SS [1 ]
机构
[1] Clark Atlanta Univ, Dept Phys, Atlanta, GA 30314 USA
关键词
atomic data; atomic processes; Sun : UV radiation; Sun; X-rays; gamma rays;
D O I
10.1086/430471
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
Electron collisional excitation strengths and rates for ultraviolet and X- ray lines arising from transitions between the fine- structure levels of the 2s(2)2p(3) S-4(o), D-2(o), and P-2(o) terms and from these levels to the levels of the 2s2p(4), 2p(5), 2s(2)2p(2)3s, 2s(2)2p(2)3p, and 2s(2)2p(2)3d configurations have been calculated using Breit- Pauli R- matrix method. Configuration- interaction wave functions have been used for an accurate representation of target levels. These wave functions give excitation energies and oscillator strengths which are in close agreement with experiment and other accurate calculations. The Rydberg series of resonances converging to the n = 2 and n = 3 excited levels are explicitly included in the scattering calculation. Resonance structures make significant contribution to collision strengths. The effective collision strengths are obtained by integrating total collision strengths over a Maxwellian distribution of electron energies, and these are presented over a wide temperature range suitable for modeling of astrophysical plasmas. Significant differences with earlier results of effective collision strengths are noted.
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页码:167 / 180
页数:14
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