Probing Nanotribological and Electrical Properties of Organic Molecular Films with Atomic Force Microscopy

被引:10
作者
Park, Jeong Young [1 ]
Qi, Yabing [2 ,3 ]
机构
[1] Korea Adv Inst Sci & Technol, Grad Sch EEWS, WCU Program, Taejon 305701, South Korea
[2] Univ Calif Berkeley, Appl Sci & Technol Grad Grp, Berkeley, CA 94720 USA
[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
关键词
self-assembled monolayer; friction; charge transport; polymer films; atomic force microscopy; SELF-ASSEMBLED MONOLAYERS; OCTADECYLTRICHLOROSILANE MONOLAYERS; FRICTIONAL-PROPERTIES; METAL JUNCTIONS; ALKYL; CALIBRATION; DEPENDENCE; EVOLUTION; PRESSURE; AU(111);
D O I
10.1002/sca.20182
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Structural aspects of organic molecular films, such as disordering, packing density, molecular bending or tilts, and phase separation, influence electrical properties as well as friction and adhesion. This indicates a correlation between nanomechanical and charge transport properties of molecular films at the molecular scale. In this review, we highlight the recent studies on correlations between charge transport and nanomechanical properties probed with atomic force microscopy. We discuss the key issues that determine charge transport and nanomechanical properties on several organic molecular films, including self-assembled monolayers formed by saturated hydrocarbon molecules conjugated molecules, and hybrid molecules as well as polymer and polymer blend films. We address the role of molecular deformation and bending in friction and conductance measurements. SCANNING 32: 257-264, 2010. (c) 2010 Wiley Periodicals, Inc.
引用
收藏
页码:257 / 264
页数:8
相关论文
共 34 条
  • [1] Relationship between friction and molecular structure: Alkylsilane lubricant films under pressure
    Barrena, E
    Kopta, S
    Ogletree, DF
    Charych, DH
    Salmeron, M
    [J]. PHYSICAL REVIEW LETTERS, 1999, 82 (14) : 2880 - 2883
  • [2] Molecular packing changes of alkanethiols monolayers on Au(111) under applied pressure
    Barrena, E
    Ocal, C
    Salmeron, M
    [J]. JOURNAL OF CHEMICAL PHYSICS, 2000, 113 (06) : 2413 - 2418
  • [3] Nanotribological properties and mechanisms of alkylthiol and biphenyl thiol self-assembled monolayers studied by AFM
    Bhushan, B
    Liu, HW
    [J]. PHYSICAL REVIEW B, 2001, 63 (24)
  • [4] Thiol-terminated monolayers on oxide-free Si:: Assembly of semiconductor-alkyl-S-metal junctions
    Boecking, Till
    Salomon, Adi
    Cahen, David
    Gooding, J. Justin
    [J]. LANGMUIR, 2007, 23 (06) : 3236 - 3241
  • [5] Morphology evolution via self-organization and lateral and vertical diffusion in polymer: fullerene solar cell blends
    Campoy-Quiles, Mariano
    Ferenczi, Toby
    Agostinelli, Tiziano
    Etchegoin, Pablo G.
    Kim, Youngkyoo
    Anthopoulos, Thomas D.
    Stavrinou, Paul N.
    Bradley, Donal D. C.
    Nelson, Jenny
    [J]. NATURE MATERIALS, 2008, 7 (02) : 158 - 164
  • [6] Friction-anisotropy dependence in organic self-assembled monolayers
    Chen, J.
    Ratera, I.
    Murphy, A.
    Ogletree, D. F.
    Frechet, J. M. J.
    Salmeron, M.
    [J]. SURFACE SCIENCE, 2006, 600 (18) : 4008 - 4012
  • [7] Atomic force microscopy study of the mechanical and electrical properties of monolayer films of molecules with aromatic end groups
    Fang, Liang
    Park, J. Y.
    Ma, H.
    Jen, A. K. -Y.
    Salmeron, M.
    [J]. LANGMUIR, 2007, 23 (23) : 11522 - 11525
  • [8] Nanotribology of octadecyltrichlorosilane monolayers and silicon: Self-mated versus unmated interfaces and local packing density effects
    Flater, Erin E.
    Ashurst, W. Robert
    Carpick, Robert W.
    [J]. LANGMUIR, 2007, 23 (18) : 9242 - 9252
  • [9] OCTADECYLTRICHLOROSILANE MONOLAYERS AS ULTRATHIN GATE INSULATING FILMS IN METAL-INSULATOR-SEMICONDUCTOR DEVICES
    FONTAINE, P
    GOGUENHEIM, D
    DERESMES, D
    VUILLAUME, D
    GARET, M
    RONDELEZ, F
    [J]. APPLIED PHYSICS LETTERS, 1993, 62 (18) : 2256 - 2258
  • [10] Local Charge Trapping in Conjugated Polymers Resolved by Scanning Kelvin Probe Microscopy
    Hallam, Toby
    Lee, MiJung
    Zhao, Ni
    Nandhakumar, Iris
    Kemerink, Martijn
    Heeney, Martin
    McCulloch, Iain
    Sirringhaus, Henning
    [J]. PHYSICAL REVIEW LETTERS, 2009, 103 (25)