Signal-to-noise ratio in x ray dark-field imaging using a grating interferometer

被引:44
|
作者
Chabior, Michael [1 ]
Donath, Tilman [2 ,3 ]
David, Christian [2 ]
Schuster, Manfred [1 ]
Schroer, Christian [4 ]
Pfeiffer, Franz [5 ]
机构
[1] Siemens AG, Corp Technol, D-80200 Munich, Germany
[2] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
[3] Dectris Ltd, CH-5400 Baden, Switzerland
[4] Tech Univ Dresden, D-01062 Dresden, Germany
[5] Tech Univ Munich, D-85748 Garching, Germany
关键词
MATHEMATICAL-ANALYSIS; COMPUTED-TOMOGRAPHY; CONTRAST;
D O I
10.1063/1.3630051
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this work, we report an analytical and experimental investigation of the signal-to-noise ratio for a recently developed method called x ray dark-field imaging. Our approach is based on the propagation of signal and noise through the reconstruction algorithm. We find that the statistical nature of the dark-field images can be understood by a Rician distribution. The analysis shows that, for high flux, the noise in the dark-field images is proportional to the noise in the raw data. In the limit of low flux and, thus, low signal-to-noise ratio, the dark-field signal exhibits a breakdown of the signal transmission, which can be described by an asymptotic behavior of the underlying noise distribution. In this limit, the dark-field signal is no longer connected to the coherence degradation, but rather to the attenuation in the sample. The model is verified in exemplary test measurements using a compact laboratory setup with a polychromatic source and a photon counting detector. (C) 2011 American Institute of Physics. [doi:10.1063/1.3630051]
引用
收藏
页数:8
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