共 50 条
- [41] Inverse scattering for reflection intensity phase microscopy BIOMEDICAL OPTICS EXPRESS, 2020, 11 (02): : 911 - 926
- [43] Scanning reflection ion microscopy in a helium ion microscope BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2015, 6 : 1125 - 1137
- [46] Superresolution reflection microscopy via absorbance modulation: a theoretical study OPTICS EXPRESS, 2018, 26 (05): : 5327 - 5341