Optical properties of epitaxial BiFeO3 thin films grown on LaAlO3

被引：46

作者：

Himcinschi, Cameliu ^{[1
]}

Bhatnagar, Akash ^{[2
,3
]}

Talkenberger, Andreas ^{[1
]}

Barchuk, Mykhailo ^{[4
]}

Zahn, Dietrich R. T. ^{[5
]}

Rafaja, David ^{[4
]}

Kortus, Jens ^{[1
]}

Alexe, Marin ^{[3
]}

机构：

[1] Tech Univ Bergakad Freiberg, Inst Theoret Phys, D-09596 Freiberg, Germany

[2] Max Planck Inst Microstruct Phys, D-06120 Halle, Germany

[3] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England

[4] Tech Univ Bergakad Freiberg, Inst Mat Sci, D-09596 Freiberg, Germany

[5] Tech Univ Chemnitz, D-09107 Chemnitz, Germany

来源：

APPLIED PHYSICS LETTERS | 2015年 / 106卷 / 01期

关键词：

POLARIZATION; MECHANISM; STRAIN;

D O I：

10.1063/1.4905443

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Highly strained and nearly pseudomorphic BiFeO3 epitaxial films were deposited on LaAlO3 and TbScO3 substrates, respectively. The symmetry of the tetragonal-like BiFeO3 films is discussed based on polarisation dependent Raman measurements and on the comparison with Raman spectra measured for rhombohedral films deposited on TbScO3. The evaluation of ellipsometric spectra reveals that the films deposited on LaAlO3 are optically less dense and the features in complex dielectric function are blue-shifted by 0.3 eV as compared to the rhombohedral films. Optical bandgaps of 3.10 eV and 2.80 eV were determined for the films deposited on LaAlO3 and TbScO3, respectively. The shift in the optical bandgap and dielectric function is nearly preserved also for thicker films, which indicates that the compressive strain is retained even in films with thicknesses above 100 nm as was confirmed also by XRD investigations. (C) 2015 AIP Publishing LLC.

引用

页数：5

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