Room temperature electron transport properties of single C60 studied using scanning tunneling microscope and break junctions

被引：0

作者：

Cheng, Ruihua ^{[1
]}

Carvell, Jeffery ^{[1
]}

Fradin, F. Y. ^{[2
,3
]}

机构：

[1] Indiana Univ Purdue Univ, Dept Phys, Indianapolis, IN 46202 USA

[2] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA

[3] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2010年 / 108卷 / 05期

关键词：

TRANSISTOR;

D O I：

10.1063/1.3481027

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report the measurements of the electron transport of an individual C-60 molecule through the combination of two experimental efforts. The nanometer-sized junctions were fabricated using electromigration combined with electron beam lithography and shadow effect evaporation. We performed the scanning tunneling microscopy/spectroscopy measurements of dispersed C-60 molecules which were deposited on a highly ordered pyrolytic graphite substrate. The single electron tunneling through a single C-60 molecule due to the Coulomb blockage effect is observed at room temperature. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3481027]

引用

页数：4

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