SiC ceramic micropatterns from polycarbosilanes

Micropattemed SiC ceramics were fabricated from polycarbosilanes applying a softlithographic replication technique. A polydimethylsiloxane mould replicated from a photolithographic microstructured silicon wafer was used as master structure. The polydimethylsiloxane mould was coated with a solution containing a mixture of two different polycarbosilanes in n-octane. After treatment at 200-400 degrees C the cross-linked polycarbosilane films were debonded and pyrolysed at 900 degrees C in nitrogen and subsequently crystallised at temperatures up to 1500 degrees C in argon. The cross-linking and thermal degradation behaviour of the polycarbosilanes was investigated by Fourier-transform infrared spectroscopy, differential scanning calorimetry and thermogravimetric analysis. X-ray diffractrometry showed the expected development of a nanocrystalline beta-SiC (3 nm) as the main phase with increasing temperature. However, traces of alpha-SiO2 derived from the polycarbosilane precursors were also detected by X-ray analysis. Removal of the alpha-SiO2 dioxide with hydrofluoric acid in the pyrolysed samples and subsequent increased the crystallite size to 7 nm. The Young's modulus determined by nanoindentation was increased from 3 GPa after cross-linking to 110 GPa after crystallisation. Scanning electron microscopy revealed, that the initial micropatterns were fully retained in the pyrolysed and crystallised SiC ceramics. The micropatterned cross-linked and crystallised beta-SiC based substrates exhibited light scattering characteristics, which qualify them as promising candidates for diffractive optical elements in microoptical applications. (C) 2010 Elsevier Ltd. All rights reserved.