Reliability and Field Aging Time Using Temperature Sensors

被引:1
作者
Civilini, Massimo [1 ]
机构
[1] Cisco Syst Inc, San Jose, CA 95134 USA
来源
2010 FOURTH INTERNATIONAL CONFERENCE ON SENSOR TECHNOLOGIES AND APPLICATIONS (SENSORCOMM) | 2008年
关键词
reliability; temperature sensors; embedded sensors; data center;
D O I
10.1109/SENSORCOMM.2010.39
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the last few years the IT infrastructure system management has evolved adding features and automating most of the IT operations. Temperature sensor management is now available throughout the entire infrastructure, allowing a direct control of temperature-related parameters at the single endpoint level. This paper presents a deviation from the standard, pre-release definition of reliability, and includes field temperature effects on the failure rate, thus moving from a statistical to a more endpoint-specific definition of reliability. An implementation example of a cumulative reliability factor for data center electronic systems is also presented.
引用
收藏
页码:210 / 213
页数:4
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