Shape-optimized electrooptic beam scanners: Experiment

被引：23

作者：

Fang, JC ^{[1
]}

Kawas, MJ ^{[1
]}

Zou, J ^{[1
]}

Gopalan, V ^{[1
]}

Schlesinger, TE ^{[1
]}

Stancil, DD ^{[1
]}

机构：

[1] Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 1999年 / 11卷 / 01期

基金：

美国国家科学基金会; 美国安德鲁·梅隆基金会;

关键词：

electrooptic devices; electrooptic effects;

D O I：

10.1109/68.736393

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new horn-shaped electrooptic scanner is described with significantly improved scanning sensitivity over rectangular-shaped devices. In the new device, the shape of the scanner is chosen to follow the trajectory of the beam, An example design is described that exhibits a factor of two larger scanning sensitivity than a rectangular device with comparable maximum scanning angle. Beam propagation simulations and measurements on an experimental device verify the scanner performance.

引用

页码：66 / 68

页数：3

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