Influence of thickness on crystallization and properties of LiNbO3 thin films

被引：12
|
作者：
Simoes, AZ
González, AHM
Ries, A
Zaghete, MA
Stojanovic, BD
Varela, JA
机构：
[1] UNESP, Inst Chem, Dept Chem Phys, BR-14801970 Araraquara, SP, Brazil
[2] Univ Belgrade, Ctr Multidisciplinary Studies, Belgrade, Serbia
来源：
MATERIALS CHARACTERIZATION | 2003年 / 50卷 / 2-3期
关键词：
LiNbO3; crystallization; electrical properties;
D O I：
10.1016/S1044-5803(03)00089-5
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Thin films of lithium niobate were deposited on Pt/Ti/SiO2 (111) substrates by spin coating from the polymeric precursor method (Pechini process). Annealing in static air was performed at 500 degreesC for 3 h. The obtained films were characterized by X-ray diffraction and atomic force microscopy. The dielectric constant, dissipation factor and resistance were measured in frequency region from 10 Hz to 10 MHz and the hysteresis loop was obtained. The influence of number of layers on crystallization, morphology and properties of LiNbO3 thin films is discussed. (C) 2003 Elsevier Inc. All rights reserved.
引用
收藏
页码：239 / 244
页数：6
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