TE/TM mode full-spatial decomposition of AlGaN-based deep ultraviolet light-emitting diodes

被引:10
作者
Zhang, Shuang [1 ]
Wang, Shuai [1 ]
Zhang, Jun [1 ]
Long, Hanling [1 ]
Gao, Yang [1 ]
Dai, Jiangnan [1 ]
Chen, Changqing [1 ]
机构
[1] Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan 430074, Peoples R China
关键词
AlGaN; deep ultraviolet light emitting diodes; TE; TM mode light; sapphire sidewall roughening; EXTRACTION EFFICIENCY; OPTICAL POLARIZATION; FLIP-CHIP; BEHAVIOR;
D O I
10.1088/1361-6463/ab740b
中图分类号
O59 [应用物理学];
学科分类号
摘要
The full-spatial decomposition of transverse electric (TE)/transverse magnetic (TM) mode in AlGaN-based deep ultraviolet light-emitting diodes (DUV-LEDs) has been experimentally investigated by introducing self-built light intensity test system mainly composed of angle resolution bracket, Glan-Taylor prism and spectrometer. Through roughening the sapphire sidewall, the extraction efficiency of DUV-LED is improved, for both TE and TM mode light with no polarization selectivity. The introduction of self-built light intensity metrology system has been reflected via scribing the sapphire sidewalls using various laser conditions, which show a reliability in the enhancement validation of the light extraction efficiency. More importantly, the self-built light intensity test system enables effective feedback on epitaxial structures and chip structure design and provides a new perspective to design high efficiency AlGaN-based DUV-LEDs.
引用
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页数:7
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