Crystal growth and properties of Co2+-doped Ca3NbGa3Si2O14 single crystal

被引：5

作者：

Shi, XZ ^{[1
]}

Yuan, DR ^{[1
]}

Guo, SY ^{[1
]}

Cheng, XF ^{[1
]}

Sun, HQ ^{[1
]}

Li, ZF ^{[1
]}

Song, JA ^{[1
]}

机构：

[1] Shandong Univ, State Key Lab Crystal Mat, Jinan 250100, Peoples R China

来源：

JOURNAL OF CRYSTAL GROWTH | 2005年 / 277卷 / 1-4期

基金：

中国国家自然科学基金;

关键词：

X-ray diffraction; Czochralski method; gallium compounds;

D O I：

10.1016/j.jcrysgro.2005.01.083

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

In this paper, single crystal of cobalt (Co)-doped Ca3NbGa3Si2O14 (CNGS) has been grown along b-axis using the Czochralski technique. The structure of the crystal has been studied by the X-ray powder diffraction (XRPD) method. The differential scanning calorimetric experiment shows that the Co2+-doped CNGS crystal melted at 1339.3 degrees C. The transmittance and fluorescence spectra of Co2+-doped CNGS crystal were measured at room temperature. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：406 / 409

页数：4

共 9 条

[1]

Belokoneva E. L., 1981, Soviet Physics - Doklady, V26, P931

[2] A new class of ordered langasite structure compounds [J].

Chai, BHT ;

Bustamante, ANP ;

Chou, MC .

PROCEEDINGS OF THE 2000 IEEE/EIA INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM & EXHIBITION, 2000, :163-168

[3]

Kang YH, 2001, J CERAM PROCESS RES, V2, P170

[4] Growth and characterization of La3Ta0.5Ga5.5O14 single crystals [J].

Kawanaka, H ;

Takeda, H ;

Shimamura, K ;

Fukuda, T .

JOURNAL OF CRYSTAL GROWTH, 1998, 183 (1-2) :274-277

[5]

Mill B. V., 1998, RUSS J INORG CHEM, V43, P1168

[6] Growth and characterization of La3Nb0.5Ga5.5O14 single crystals [J].

Takeda, H ;

Shimamura, K ;

Kohno, T ;

Fukuda, T .

JOURNAL OF CRYSTAL GROWTH, 1996, 169 (03) :503-508

[7] Crystal growth and properties of Ca3NbGa3Si2O14 single crystals [J].

Wang, ZM ;

Cheng, XF ;

Yuan, DR ;

Pan, LH ;

Guo, SY ;

Xu, D ;

Lv, MK .

JOURNAL OF CRYSTAL GROWTH, 2003, 249 (1-2) :240-244

[8]

YU V, 1998, P IEEE INT FREQ CONT, V742

[9]

YU V, 1995, IEEE T ULTRASON FERR, V42, P653

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