Dead-time correction of a multi-element SSD for fluorescent XAFS

被引:54
作者
Nomura, M [1 ]
机构
[1] KEK, Photon Factory, Inst Mat Struct Sci, Tsukuba, Ibaraki 305, Japan
关键词
solid-state detector systems; fluorescent XAFS; dead-time corrections; counting losses;
D O I
10.1107/S090904959800003X
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The correct evaluation of the live time of a detection system is found to be important for correcting the counting loss of a multielement detection system for fluorescent XAFS experiments. Synchronous resetting of preamplifiers and the suspension of electronics during the reset period is an effective method. The dead time of the incoming count rate should also be corrected, since its non-linearity cannot be neglected. A 19-element solid-state detector system which can count up to 3.7 x 10(5) counts s(-1) channel(-1) with <270 eV FWHM for Mn K alpha has been realized; the dead time was independent of the incoming photon energy.
引用
收藏
页码:851 / 853
页数:3
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