共 50 条
- [43] Atomic force microscopy and lateral force microscopy using piezoresistive cantilevers JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 856 - 860
- [45] Atomic force microscopy and lateral force microscopy using piezoresistive cantilevers Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena, 1996, 14 (02):
- [48] Investigation of Nanotribological Characterization of Stretched European Hair Using Atomic Force Microscopy ADVANCES IN TEXTILE ENGINEERING AND MATERIALS III, PTS 1 AND 2, 2013, 821-822 : 274 - 277