Towards Adaptive Test of Multi-core RF SoCs

被引：0
|
作者：
Mittal, Rajesh [1 ]
Balasubramanian, Lakshmanan [1 ]
Kumar, Chethan Y. B. [1 ]
Devanathan, V. R. [1 ]
Kawoosa, Mudasir [1 ]
Parekhji, Rubin A. [1 ]
机构：
[1] Texas Instruments India Private Ltd, Bangalore 560093, Karnataka, India
来源：
DESIGN, AUTOMATION & TEST IN EUROPE | 2013年
关键词：
Adaptive test; RF test; multi-core chips; test time optimization;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper discusses how adaptive test techniques can be applied to multi-core RF SoCs, together with design implementation and test challenges. Various techniques specific to RF circuits covering calibration trims, power management modules, co-existence issues, concurrent testing, and test measurements are explained. Results on different designs are presented. Together, they highlight the need and scope of adaptive test for RF circuits, and share a new dimension in the test of multi-core circuits, under different constraints of design, test and test equipment.
引用
收藏
页码：743 / 748
页数：6
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