Carbon impurities and the yellow luminescence in GaN

被引:552
|
作者
Lyons, J. L. [1 ]
Janotti, A. [1 ]
Van de Walle, C. G. [1 ]
机构
[1] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA
基金
美国国家科学基金会;
关键词
GALLIUM VACANCIES; DEFECTS; ACCEPTOR;
D O I
10.1063/1.3492841
中图分类号
O59 [应用物理学];
学科分类号
摘要
Using hybrid functional calculations we investigate the effects of carbon on the electrical and optical properties of GaN. In contrast to the currently accepted view that C substituting for N (C-N) is a shallow acceptor, we find that C-N has an ionization energy of 0.90 eV. Our calculated absorption and emission lines also indicate that C-N is a likely source for the yellow luminescence that is frequently observed in GaN, solving the longstanding puzzle of the nature of the C-related defect involved in yellow emission. Our results suggest that previous experimental data, analyzed under the assumption that C-N acts as a shallow acceptor, should be re-examined. (c) 2010 American Institute of Physics. [doi:10.1063/1.3492841]
引用
收藏
页数:3
相关论文
共 50 条
  • [31] Room-temperature infrared photoluminescence in GaN doped with various impurities
    Gaubas, E.
    Ceponis, T.
    Deveikis, L.
    Dobrovolskas, D.
    Rumbauskas, V.
    Viliunas, M.
    OPTICAL MATERIALS, 2019, 94 : 266 - 271
  • [32] Carbon-tuned cathodoluminescence of semi-insulating GaN
    Kakanakova-Georgieva, A.
    Forsberg, U.
    Janzen, E.
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2011, 208 (09): : 2182 - 2185
  • [33] Kinetic path towards the passivation of threading dislocations in GaN by oxygen impurities
    Christenson, Sayre
    Xie, Weiyu
    Sun, Yi-Yang
    Zhang, S. B.
    PHYSICAL REVIEW B, 2017, 95 (12)
  • [34] Effects of residual C and O impurities on photoluminescence in undoped GaN epilayers
    Kang, JY
    Shen, YW
    Wang, ZG
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2002, 91 : 303 - 307
  • [35] Defect-Related Luminescence in Undoped GaN Grown by HVPE
    M.A. Reshchikov
    A. Usikov
    H. Helava
    Yu. Makarov
    Journal of Electronic Materials, 2015, 44 : 1281 - 1286
  • [36] Defect influence on luminescence efficiency of GaN-based LEDs
    Li, Shuping
    Fang, Zhilai
    Chen, Hangyang
    Li, Jinchai
    Chen, Xiaohong
    Yuan, Xiaoli
    Sekiguchi, Takashi
    Wang, Qiming
    Kang, Junyong
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2006, 9 (1-3) : 371 - 374
  • [37] Luminescence studies of Laser MBE grown GaN on ZnO nanostructures
    Dewan, Sheetal
    Tomar, Monika
    Kapoor, Ashok K.
    Tandon, R. P.
    Gupta, Vinay
    NANOENGINEERING: FABRICATION, PROPERTIES, OPTICS, AND DEVICES XIV, 2017, 10354
  • [38] Defect-Related Luminescence in Undoped GaN Grown by HVPE
    Reshchikov, M. A.
    Usikov, A.
    Helava, H.
    Makarov, Yu.
    JOURNAL OF ELECTRONIC MATERIALS, 2015, 44 (05) : 1281 - 1286
  • [39] Suppression of Green Luminescence of Mg-Ion-Implanted GaN by Subsequent Implantation of Fluorine Ions at High Temperature
    Takahashi, Masahiro
    Tanaka, Atsushi
    Ando, Yuto
    Watanabe, Hirotaka
    Deki, Manato
    Kushimoto, Maki
    Nitta, Shugo
    Honda, Yoshio
    Shima, Kohei
    Kojima, Kazunobu
    Chichibu, Shigefusa F.
    Chen, Kevin J.
    Amano, Hiroshi
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2020, 257 (04):
  • [40] Properties of carbon as an acceptor in cubic GaN
    Köhler, U
    Lübbers, M
    Mimkes, J
    As, DJ
    PHYSICA B-CONDENSED MATTER, 2001, 308 : 126 - 129