Photodegradation of the organic/metal cathode interface in organic light-emitting devices

被引：33

作者：

Wang, Qi ^{[1
]}

Luo, Yichun ^{[1
]}

Aziz, Hany ^{[1
]}

机构：

[1] Univ Waterloo, Dept Elect & Comp Engn, Waterloo, ON N2L 3G1, Canada

来源：

APPLIED PHYSICS LETTERS | 2010年 / 97卷 / 06期

基金：

加拿大自然科学与工程研究理事会;

关键词：

electroluminescence; lighting; optical fabrication; optical testing; organic light emitting diodes; DEGRADATION; DIODES;

D O I：

10.1063/1.3480412

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We study the photostability of organic light-emitting devices (OLEDs). Irradiating OLEDs by external illumination is found to result in a gradual increase in driving voltage and decrease in electroluminescence (EL) efficiency. This photoinduced degradation in device performance is found to be caused by changes at the organic/metal cathode interface that lead to a deterioration in electron injection. Evidence of photodegradation of the same interface, inherently, by device own EL, is also reported. The results uncover an important degradation mechanism in OLEDs and shed the light on a phenomenon that might limit the stability of other organic optoelectronic and photovoltaic devices. (C) 2010 American Institute of Physics. [doi:10.1063/1.3480412]

引用

页数：3

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