Imaging Performance Analysis & Comparison between A High Sensitivity Low level light CMOS Detector and An EMCCD

被引:0
|
作者
Bu Hongbo [1 ]
Wang Gengyun [1 ]
Zhai Guofang [1 ]
Li Yongqiang [1 ]
Li Haoyang [1 ]
机构
[1] Beijing Inst Space Mech & Elect, 104 You Yi Lu, Beijing 100076, Peoples R China
关键词
CMOS; detector; low level light; EMCCD; SNR; high sensitivity; camera; imaging circuits;
D O I
10.1117/12.2500774
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The Low level light sensor has evolved from early ICCD device to EMCCD that appeared at the beginning of this century. With the continuous progress of CMOS technology, the scientific CMOS sensors were developed, which have been used for industrial cameras in high sensitivity imaging. This article described a low level light CMOS detector and its associated camera, which were developed by Beijing Institute of Space Mechanics and Electricity (BISME) in cooperation with a domestic detector manufacturer. We had an in-depth discussion of the chip's high sensitivity design techniques and analyze the weak charge transfer optimization mechanism. Then both the CMOS and EMCCD detector were combined with lens and video processing circuits to conduct a laboratorial test, finally low light detection performance of them were compared and analyzed. The SNR of CMOS imaging circuits was basically equal to the EMCCD imaging circuits when the camera's entrance pupil radiance was less than 0.5E-05 W/m(2)/sr, when the radiance was up to 2E-05 W/m(2)/sr, the SNR of CMOS circuits was about 2dB better than the EMCCD circuits.
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页数:9
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