Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp

被引:20
作者
Guzzinati, Giulio [1 ]
Altantzis, Thomas [1 ]
Batuk, Maria [1 ]
De Backer, Annick [1 ]
Lumbeeck, Gunnar [1 ]
Samaee, Vahid [1 ]
Batuk, Dmitry [1 ]
Idrissi, Hosni [1 ,2 ]
Hadermann, Joke [1 ]
Van Aert, Sandra [1 ]
Schryvers, Dominique [1 ]
Verbeeck, Johan [1 ]
Bals, Sara [1 ]
机构
[1] Univ Antwerp, EMAT, Groenenborgerlaan 171, B-2020 Antwerp, Belgium
[2] Catholic Univ Louvain, Inst Mech Mat & Civil Engn, B-1348 Louvain La Neuve, Belgium
基金
欧洲研究理事会;
关键词
TEM; electron diffraction tomography; STEM; atom counting; electron tomography; compressed sensing; EDS; EELS; nanomechanical testing; ACOM TEM; EQUAL-TO; 1; IN-SITU; ATOMIC-SCALE; Z-CONTRAST; DIFFRACTION APPLICATION; QUANTITATIVE-ANALYSIS; CRYSTAL-STRUCTURE; COLUMN POSITIONS; TEM; LI;
D O I
10.3390/ma11081304
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the materials down to the same scale, such as transmission electron microscopy. As Belgium's foremost electron microscopy group, among the largest in the world, EMAT is continuously contributing to the development of TEM techniques, such as high-resolution imaging, diffraction, electron tomography, and spectroscopies, with an emphasis on quantification and reproducibility, as well as employing TEM methodology at the highest level to solve real-world materials science problems. The lab's recent contributions are presented here together with specific case studies in order to highlight the usefulness of TEM to the advancement of materials science.
引用
收藏
页数:23
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