Electronic properties of nitrogen diluted hydrogenated amorphous carbon films

被引:0
|
作者
Kumar, S [1 ]
Dixit, PN [1 ]
Sarangi, D [1 ]
Bhattacharyya, R [1 ]
机构
[1] Natl Phys Lab, Thin Film Technol Grp, New Delhi 110012, India
来源
PHYSICS OF SEMICONDUCTOR DEVICES, VOLS 1 AND 2 | 1998年 / 3316卷
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中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Nitrogen doped hydrogenated amorphous carbon films were grown in an asymmetric RF-PECVD plasma system. Electrical conductivity, Urbach energy, optical bandgap, refractive index, and stress have been studied as a function of nitrogen partial pressure. Films deposited at high nitrogen partial pressure (58%) exhibits about four order of magnitude higher conductivity than film deposited without nitrogen.
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页码:1200 / 1203
页数:4
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