The Van der Pauw Method for Sheet Resistance Measurements of Polypyrrole-Coated Para-aramide Woven Fabrics

被引：38

作者：

Banaszczyk, J. ^{[1
]}

Schwarz, A. ^{[2
]}

De Mey, G. ^{[1
]}

Van Langenhove, L. ^{[2
]}

机构：

[1] Univ Ghent, Dept Elect & Informat Syst, B-9000 Ghent, Belgium

[2] Univ Ghent, Dept Text, B-907 Ghent, Belgium

来源：

JOURNAL OF APPLIED POLYMER SCIENCE | 2010年 / 117卷 / 05期

关键词：

conducting polymers; polypyrroles; coatings; aging; CONDUCTIVITY; POLYMERS; COPPER;

D O I：

10.1002/app.32186

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

In this article, it is shown that the Van der Pauw (VDP) method, generally known in microelectronics, can be successfully adapted to sheet resistance measurements of electroconductive fabrics. We prepared two polypyrrole-coated woven para-aramide fabrics and used a simple setup to measure their sheet resistances. The results were then compared with those obtained using a sophisticated commercial collinear array probe. The measurements were done in a 1 month interval, to investigate the influence of the coating aging on the sheet resistance of the samples. The influence of the contact positioning on the accuracy of the VDP measurement was investigated. (C) 2010 Wiley Periodicals, Inc. J Appl Polyrn Sci 117: 2553-2558,2010

引用

页码：2553 / 2558

页数：6

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