Manipulation and detection of electron spins by magnetic resonance force microscopy

被引：0

作者：

Rugar, D ^{[1
]}

Budakian, R ^{[1
]}

Mamin, HJ ^{[1
]}

Chui, BW ^{[1
]}

机构：

[1] IBM Corp, Almaden Res Ctr, Div Res, San Jose, CA 95120 USA

来源：

SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES | 2003年 / 696卷

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Magnetic resonance force microscopy is a technique aimed at achieving three-dimensional sub-surface imaging with atomic resolution. We discuss recent progress in using ultrasensitive force detection techniques to detect small ensembles of electron spins in SiO2. Using mass-loaded cantilevers that suppress thermal vibration noise in the upper modes, we have achieved a sensitivity of equivalent to about 2 electron spins in the natural bandwidth of the measurement (0.12 Hz).

引用

页码：45 / 52

页数：8

共 13 条

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