A high speed and area efficient on-chip analog waveform extractor

被引：17

作者：

Hajjar, A ^{[1
]}

Roberts, GW ^{[1
]}

机构：

[1] McGill Univ, Microelect & Comp Syst Lab, Montreal, PQ H3A 2A7, Canada

来源：

INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS | 1998年

关键词：

D O I：

10.1109/TEST.1998.743213

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A multiple pass A/D conversion technique is proposed for mixed-signal test applications. Only a single on-chip comparator and sample-and-hold circuit is required to digitize repetitive analog waveforms. Simulations show 10 bits of amplitude resolution at 300 MHz for a bipolar comparator design (0.8 mu m BiCMOS process), and 10 bits of amplitude resolution at 667 MHz for a CMOS comparator design (0.5 mu m CMOS process). A prototype IC designed for a 0.5 mu m CMOS process has been sent for fabrication. Experimental results from a prototype board (implemented with discrete components) are given.

引用

页码：688 / 697

页数：10