Checkered White-RGB Color LOFIC CMOS Image Sensor

被引：0

作者：

Kawada, Shun ^{[1
]}

Sakai, Shin ^{[1
]}

Tashiro, Yoshiaki ^{[1
]}

Sugawa, Shigetoshi ^{[1
]}

机构：

[1] Tohoku Univ, Grad Sch Engn, Sendai, Miyagi 9808579, Japan

来源：

2010 15TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC 2010) | 2010年

关键词：

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

We succeeded in developing a checkered White-RGB color CMOS image sensor based on a lateral overflow integration capacitor (LOFIC) architecture. The LOFIC CMOS image sensor with a 1/3.3-inch optical format, 1280(H) x 480(V) pixels, 42-mu m effective pixel pitch along with 45 degrees direction was designed and fabricated through 0.18-mu m 2-Poly 3-Metal CMOS technology with buried pinned photodiode (PD) process. The image sensor has achieved about 108-mu V/e(-) high conversion gain and about 102-dB dynamic range (DR) performance in one exposure.

引用

页码：342 / 343

页数：2

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