Structural, morphological and optical characterization of Ti-doped ZnO nanorod thin film synthesized by spray pyrolysis technique
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作者:
Rajasekaran, M.
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Bharathiar Univ, Dept Phys, Res & Dev Ctr, Coimbatore 641046, Tamil Nadu, India
Thiru A Govindasamy Govt Arts Coll, PG Res Dept Phys, Tindivanam 604002, Tamil Nadu, IndiaBharathiar Univ, Dept Phys, Res & Dev Ctr, Coimbatore 641046, Tamil Nadu, India
Rajasekaran, M.
[1
,2
]
Arunachalam, A.
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Sri Vinayaga Coll Arts & Sci, Dept Phys, Ulundurpet 606107, Tamil Nadu, IndiaBharathiar Univ, Dept Phys, Res & Dev Ctr, Coimbatore 641046, Tamil Nadu, India
Arunachalam, A.
[3
]
Kumaresan, P.
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Thiru A Govindasamy Govt Arts Coll, PG Res Dept Phys, Tindivanam 604002, Tamil Nadu, IndiaBharathiar Univ, Dept Phys, Res & Dev Ctr, Coimbatore 641046, Tamil Nadu, India
Kumaresan, P.
[2
]
机构:
[1] Bharathiar Univ, Dept Phys, Res & Dev Ctr, Coimbatore 641046, Tamil Nadu, India
[2] Thiru A Govindasamy Govt Arts Coll, PG Res Dept Phys, Tindivanam 604002, Tamil Nadu, India
[3] Sri Vinayaga Coll Arts & Sci, Dept Phys, Ulundurpet 606107, Tamil Nadu, India
Thin films of pure and Ti metal ion doped ZnO were grown on glass substrate by spray pyrolysis for various doping ratios keeping the temperature at 400 degrees C. Impact of Ti doping on morphological, optical and structural properties of ZnO was investigated. Structural confirmation of the thin-film was analyzed by using X-ray diffraction (XRD) studies and it concluded the successful growth of standard thin films of hexagonal wurtzite structure which was polycrystalline in nature. The morphological studies carried out using Scanning Electronic microscope (SEM), endorsed a uniform distribution of grain that are spherical in nature. Composition analysis by energy dispersive spectroscopy showed the presence of Ti, Zn and O in the films. Average grain size was estimated using Scherrer formula and obtained to be in the range of 35 to 50 nm. Atomic force microscopy was used to provide the surface roughness that had increased with the increase of Ti concentration. In the visible region, these films were found to be highly transparent and the average transmittance was obtained to be 85%. Photoluminescence spectral analysis showed a near band edge emission at 397 nm.
机构:
Shivaji Univ, Dept Phys, Thin Film Mat Lab, Kolhapur 416004, Maharashtra, IndiaShivaji Univ, Dept Phys, Thin Film Mat Lab, Kolhapur 416004, Maharashtra, India
Tarwal, N. L.
Patil, P. S.
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Shivaji Univ, Dept Phys, Thin Film Mat Lab, Kolhapur 416004, Maharashtra, IndiaShivaji Univ, Dept Phys, Thin Film Mat Lab, Kolhapur 416004, Maharashtra, India