Simultaneous thermal analysis of samples in the Bi2O3-P2O5-SiO2 system: Comparison with the KEMS data

被引:2
作者
Stolyarova, V. L. [1 ]
Vorozhtcov, V. A. [1 ,2 ]
Lopatin, S., I [1 ]
Ugolkov, V. L. [2 ]
机构
[1] St Petersburg State Univ, 7-9 Univ Skaya Nab, St Petersburg 199034, Russia
[2] Russian Acad Sci, Grebenshchikov Inst Silicate Chem, 2 Admiral Makarov Nab, St Petersburg 199034, Russia
基金
俄罗斯基础研究基金会;
关键词
KEMS; TGA; DSC; X-ray phase analysis; Melting; Vaporization; THERMODYNAMIC PROPERTIES; VAPORIZATION PROCESSES; PHASE-EQUILIBRIA; TEMPERATURE; CALIBRATION; GASES; BI2O3; HEAT;
D O I
10.1016/j.tca.2020.178531
中图分类号
O414.1 [热力学];
学科分类号
摘要
This paper presents and compares the results of investigation of the samples in the Bi2O3-P2O5-SiO2 system by means of simultaneous thermal analysis, X-ray phase analysis, and Knudsen effusion mass spectrometry. The samples were synthesized by the melt quenching technique using Bi2O3, SiO2, and NH4H2PO4. By differential scanning calorimetry, characteristic temperatures and enthalpies of phase transformations in the samples were determined. Mass losses of the samples obtained by thermogravimetric analysis in dynamic air flow were compared with those found by Knudsen effusion mass spectrometry in vacuum. Using X-ray phase analysis, unknown phases were identified in several samples. These phases might consist of previously unknown compounds containing bismuth, phosphorus, and silicon together. The results of the present study should be regarded as being preliminary information concerning phase equilibria in the Bi2O3-P2O5-SiO2 system.
引用
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页数:7
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