Application of free-standing multilayer films as polarizers for X-ray radiation

被引：12

作者：

Andreev, SS ^{[1
]}

Bibishkin, MS ^{[1
]}

Chkhalo, NI ^{[1
]}

Lopatin, AY ^{[1
]}

Luchin, VI ^{[1
]}

Pestov, AE ^{[1
]}

Prokhorov, KA ^{[1
]}

Salaschchenko, NN ^{[1
]}

机构：

[1] RAS, Inst Phys Microstruct, Nizhnii Novgorod 603950, Russia

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2005年 / 543卷 / 01期

关键词：

multilayer mirror; X-ray radiation; polarization;

D O I：

10.1016/j.nima.2005.01.252

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The problem of optimization of free-standing multilayer films based on Cr/C and Cr/Sc materials for polarization of X-ray radiation with wavelength of 3.14 nm (Ti L alpha line) and 4.47 nm (C K alpha line) is tackled. An experimental setup for the investigation of polarization properties of the films is described. Experimental data on measured transmission coefficients and polarization degree for Cr/C multilayer films are given. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：340 / 345

页数：6

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