Ultrahigh-sensitivity single-photon detection with linear-mode silicon avalanche photodiode

被引：27

作者：

Akiba, Makoto ^{[1
]}

Tsujino, Kenji ^{[1
,2
]}

Sasaki, Masahide ^{[1
]}

机构：

[1] Natl Inst Informat & Commun Technol, Quantum ICT Grp, Koganei, Tokyo 1848795, Japan

[2] Japan Sci & Technol Agcy, NEC Tsukuba Labs, Tsukuba, Ibaraki 3058501, Japan

来源：

OPTICS LETTERS | 2010年 / 35卷 / 15期

关键词：

PERFORMANCE;

D O I：

10.1364/OL.35.002621

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We developed an ultrahigh-sensitivity single-photon detector using a linear-mode avalanche photodiode (APD) with a cryogenic low-noise readout circuit; the APD is operated at 78 K. The noise-equivalent power of the detector is as low as 2.2 x 10(-20) W/Hz(1/2) at a wavelength of 450 nm. The photon-detection efficiency and dark-count rate (DCR) are 0.72 and 0.0008 counts/s, respectively. A low DCR is achieved by thermal treatment for reducing the trapped carriers when the thermal treatment temperature is above 100 K. (C) 2010 Optical Society of America

引用

页码：2621 / 2623

页数：3

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