Dual-probe scanning tunneling microscope: Measuring a carbon nanotube ring transistor

被引：96

作者：

Watanabe, H ^{[1
]}

Manabe, C ^{[1
]}

Shigematsu, T ^{[1
]}

Shimizu, M ^{[1
]}

机构：

[1] Fuji Xerox Co Ltd, Corp Res Ctr, Adv Res Lab, Minamiashigara, Kanagawa 2500111, Japan

来源：

APPLIED PHYSICS LETTERS | 2001年 / 78卷 / 19期

关键词：

D O I：

10.1063/1.1371529

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have constructed a dual-probe scanning tunneling microscope (D-STM). We used multiwall carbon nanotubes [(NT), diameter: similar to 10 nm] as STM probes. The D-STM allows us to elucidate the electric property of a sample with a spatial resolution of similar to1 nm. Using this system, we have measured the current-voltage curves of a single NT ring as a transistor. The curves show the possibility of nanometer-scale electronic circuits composed of NT devices. (C) 2001 American Institute of Physics.

引用

页码：2928 / 2930

页数：3

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