Sensitivity of imaging properties of metal-dielectric layered flat lens to fabrication inaccuracies

被引：23

作者：

Kotynski, R. ^{[1
]}

Baghdasaryan, H. ^{[2
]}

Stefaniuk, T. ^{[1
]}

Pastuszczak, A. ^{[1
]}

Marciniak, M. ^{[3
]}

Lavrinenko, A. ^{[4
]}

Panajotov, K. ^{[5
,6
]}

Szoplik, T. ^{[1
]}

机构：

[1] Univ Warsaw, Fac Phys, PL-02093 Warsaw, Poland

[2] State Engn Univ Armenia, Fiber Opt Commun Lab, Yerevan 0009, Armenia

[3] Inst Natl Telecommun, PL-04894 Warsaw, Poland

[4] Tech Univ Denmark, Dept Photon Engn, DK-2800 Lyngby, Denmark

[5] Vrije Univ Brussel, IR TONA, Dept Appl Phys & Photon, B-1050 Brussels, Belgium

[6] Bulgarian Acad Sci, Inst Solid State Phys, BU-1784 Sofia, Bulgaria

来源：

OPTO-ELECTRONICS REVIEW | 2010年 / 18卷 / 04期

关键词：

plasmonics; nanophotonics; nanolenses; super-resolution; metal-dielectric multilayers; FAR-FIELD SUPERLENS; SUBWAVELENGTH RESOLUTION; MULTILAYERED STRUCTURES; NEGATIVE REFRACTION; SINGLE-LAYER; SUPERRESOLUTION; FIDELITY;

D O I：

10.2478/s11772-010-0051-6

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We characterize the sensitivity of imaging properties of a layered silver-TiO2 flat lens to fabrication inaccuracies. The lens is designed for approximately diffraction-free imaging with subwavelength resolution at distances in the order of a wavelength. Its operation may be attributed to self-collimation with a secondary role of Fabry-Perot resonant transmission, even though the first order effective medium description of the structure is inaccurate. Super-resolution is maintained for a broad range of overall thicknesses and the total thickness of the multilayer is limited by absorption. The tolerance analysis indicates that the resolution and transmission efficiency are highly sensitive to small changes of layer thicknesses.

引用

页码：446 / 457

页数：12

共 39 条

[1]

[Anonymous], 2008, Introduction to Fourier optics

[2]

Baghdasaryan H.V., 2008, P EUR MICROW ASS, V4, P76

[3] Problem of plane EM wave self-action in multilayer structure: an exact solution [J].